Intrinsic point defects investigation in InAlAs with extrapolated defect transition level

Author:

Fang Yuxin,Zhang Jialin,Su Yongbo,Jin Zhi,Zhong YinghuiORCID

Publisher

Elsevier BV

Reference42 articles.

1. A review of InP/InAlAs/InGaAs based transistors for high frequency applications;Ajayan;Superlattice. Microst.,2015

2. A comparative study on radiation reliability of composite channel InP high electron mobility transistors;Zhang;Chin. Phys. B,2021

3. InAs/InGaAs quantum dots confined by InAlAs barriers for enhanced room temperature light emission: Photoelectric properties and deep levels;Golovynskyi;Microelectron. Eng.,2021

4. "High-performance back-illuminated InGaAs/InAlAs MSM photodetector with a record responsivity of 0.96 A/W." Photonics Technology Letters;Kim;IEEE,1992

5. Maximum frequency of oscillation of 1.3 THz obtained by using an extended drain-side recess structure in 75-nm-gate InAlAs/InGaAs high-electron-mobility transistors;Takahashi;APEX,2017

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