Extraction of Process Variation Parameters in FinFET Technology Based on Compact Modeling and Characterization-Reference-Cited by-同舟云学术

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Extraction of Process Variation Parameters in FinFET Technology Based on Compact Modeling and Characterization

Published:2018-03 Issue:3 Volume:65 Page:847-854
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Zhang Zhe^ORCID,Jiang Xiaobo^ORCID,Wang Runsheng^ORCID,Guo Shaofeng,Wang Yangyuan,Huang Ru

Funder

NSFC

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/8299498/08260527.pdf?arnumber=8260527

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