Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe With RF Stimulation-Reference-Cited by-同舟云学术

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Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe With RF Stimulation

Published:2018-04 Issue:4 Volume:67 Page:745-753
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Mai-Khanh Nguyen Ngoc,Nakajima Shigeru,Iizuka Tetsuya,Mita Yoshio,Asada Kunihiro

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/8309486/08268548.pdf?arnumber=8268548

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