An Advanced Forward Asymmetric Correction Method for an Electromagnetic Near-Field Probing System-Reference-Cited by-同舟云学术

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An Advanced Forward Asymmetric Correction Method for an Electromagnetic Near-Field Probing System

Published:2024-02 Issue:2 Volume:72 Page:1661-1672
ISSN:0018-926X
Container-title:IEEE Transactions on Antennas and Propagation
language:
Short-container-title:IEEE Trans. Antennas Propagat.

Author:

Shao Weiheng¹^ORCID,Xue Shan²^ORCID,Tian Xinxin¹^ORCID,He Liuxing¹,Wang Hongyue¹^ORCID,Zhou Yangyang¹,Zhou Changjian³^ORCID,Chen Yiqiang¹^ORCID

Affiliation:

1. China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI), Guangzhou, China

2. School of Physics and Optoelectronic Engineering, Guangdong University of Technology, Guangzhou, China

3. School of Microelectronics, South China University of Technology, Guangzhou, China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Guangdong Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/8/10436398/10382966.pdf?arnumber=10382966

Reference37 articles.

1. Electromagnetic Interference (EMI) of System-on-Package (SOP)

2. An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application

3. Applications of the Near-Field Techniques in EMC Investigations

4. Near-Field Shielding Analysis of Conformal Coating Materials for Integrated Circuits

5. A Simple Equivalent Circuit Model for Shielding Analysis of Magnetic Sheets Based on Microstrip Line Measurement

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System;IEEE Sensors Journal;2024-03-15

2. Four-Port Asymmetric Correction for Simultaneous Multicomponent EM-Field Measurement;IEEE Transactions on Instrumentation and Measurement;2024

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