Four-Port Asymmetric Correction for Simultaneous Multicomponent EM-Field Measurement
Author:
Affiliation:
1. China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI), Guangzhou, China
Funder
Key-Area Research and Development Program of Guangdong Province
Natural Science Foundation of Guangdong Province
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/19/10367905/10535308.pdf?arnumber=10535308
Reference35 articles.
1. Near-Field Shielding Analysis of Conformal Coating Materials for Integrated Circuits
2. Miniature Active Differential Magnetic Field Probe With High Sensitivity for Near-Field Measurements
3. Probe Characterization for Electromagnetic Near-Field Studies
4. Fault Detection of VLSI Power Supply Network Based on Current Estimation From Surface Magnetic Field
5. A Near-Field Magnetic Sensing System With High-Spatial Resolution and Application for Security of Cryptographic LSIs
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