A Tabletop X-Ray Tomography Instrument for Nanometer-Scale Imaging: Demonstration of the 1,000-Element Transition-Edge Sensor Subarray-Reference-Cited by-同舟云学术

A Tabletop X-Ray Tomography Instrument for Nanometer-Scale Imaging: Demonstration of the 1,000-Element Transition-Edge Sensor Subarray

Published:2023-08 Issue:5 Volume:33 Page:1-5
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Szypryt Paul¹^ORCID,Nakamura Nathan¹^ORCID,Becker Daniel T.¹^ORCID,Bennett Douglas A.²^ORCID,Dagel Amber L.³^ORCID,Doriese W. Bertrand²,Fowler Joseph W.¹^ORCID,Gard Johnathon D.¹,Harris J. Zachariah³,Hilton Gene C.²,Imrek Jozsef²,Jimenez Edward S.³,Larson Kurt W.³,Levine Zachary H.²^ORCID,Mates John A. B.²,McArthur D.³,Miaja-Avila Luis²,Morgan Kelsey M.¹^ORCID,O'Neil Galen C.²,Ortiz Nathan J.¹,Pappas Christine G.¹^ORCID,Schmidt Daniel R.²^ORCID,Thompson Kyle R.³,Ullom Joel N.¹,Vale Leila²,Vissers Michael R.²,Walker Christopher³,Weber Joel C.¹,Wessels Abigail L.¹,Wheeler Jason W.³,Swetz Daniel S.²

Affiliation:

1. Department of Physics, University of Colorado, Boulder, CO, USA

2. National Institute of Standards and Technology, Boulder, CO, USA

3. Sandia National Laboratories, Albuquerque, NM, USA

Funder

Office of the Director of National Intelligence

Intelligence Advanced Research Projects Activity

Rapid Analysis of Various Emerging Nanoelectronics

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials