Author:
Chugg A.M.,Moutrie M.J.,Jones R.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
20 articles.
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1. Analysis of multiple cell upset characteristics for logical circuits in radiation environment;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-12
2. A Statistical Method for MCU Extraction Without the Physical-to-Logical Address Mapping;IEEE Transactions on Nuclear Science;2020-07
3. Mutual interference induced by single event effects in CMOS circuits;AIP Advances;2020-06-01
4. PHICC;Proceedings of the 32nd Symposium on Integrated Circuits and Systems Design - SBCCI '19;2019
5. An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays;Journal of Electronic Testing;2018-07-06