On-Wafer Coplanar Waveguide Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz-Reference-Cited by-同舟云学术

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On-Wafer Coplanar Waveguide Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz

Published:2019-06 Issue:6 Volume:68 Page:2160-2167
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Pham Thi Dao^ORCID,Allal Djamel,Ziade Francois^ORCID,Bergeault Eric

Funder

French National Metrology Network (RNMF) in the framework of project n° 157 in the field of electrical metrology

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/8712472/08699095.pdf?arnumber=8699095

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurement and Analysis of On-Wafer Test Structures for Signal Integrity Assessment at Chip Level;2024 Conference on Precision Electromagnetic Measurements (CPEM);2024-07-08

2. Fast Prediction Method for Scattering Parameters of Rigid-Flex PCBs Based on ANN;Sensors;2024-03-30

3. Recommendations for the Design of Differential Thin-Film Microstrip Lines;2023 IEEE 27th Workshop on Signal and Power Integrity (SPI);2023-05-07

4. Characterization of Transmission Lines on Lossy or Dispersive Substrates With a Complete Model of a Series Resistor for Impedance Standard of Scattering Parameter Measurements;IEEE Transactions on Instrumentation and Measurement;2023

5. Nonlinear uncertainty propagation of on-wafer mixed-mode S parameter measurements using Multimode-TRL calibration;2020 Conference on Precision Electromagnetic Measurements (CPEM);2020-08

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