Measurement and Analysis of On-Wafer Test Structures for Signal Integrity Assessment at Chip Level-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Measurement and Analysis of On-Wafer Test Structures for Signal Integrity Assessment at Chip Level

Published:2024-07-08 Issue: Volume: Page:1-2
ISSN:
Container-title:2024 Conference on Precision Electromagnetic Measurements (CPEM)
language:
Short-container-title:

Author:

Pham Thi Dao¹,Ngoc Phung Gia²,Lahbacha Khitem³,Maffucci Antonio³,Miele Gianfranco³,Arz Uwe²,Allal Djamel¹

Affiliation:

1. Laboratoire National de Métrologie et D’essais (LNE),Trappes Cedex,France,78197

2. Physikalisch-Technische Bundesanstalt (PTB),Braunschweig,Germany,38116

3. University of Cassino and Southern Lazio,Dept. of Electrical and Information Engineering,Cassino,Italy

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10645824/10645825/10646002.pdf?arnumber=10646002

Reference4 articles.

1. On-Wafer Coplanar Waveguide Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz

2. Multimode TRL Calibration Technique for Characterization of Differential Devices

3. Dielectric microwave characterization of the SU-8 thick resin used in an above IC process

4. On-wafer Test Structures for the Evaluation of Signal Integrity and Power Integrity at Chip Level;Pham

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP