Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
22 articles.
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1. Design-for-Testability for Improved Path Delay Fault Coverage of Critical Paths;21st International Conference on VLSI Design (VLSID 2008);2008
2. An implicit path-delay fault diagnosis methodology;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2003-10
3. Efficient Path Delay Testing Using Scan Justification;ETRI Journal;2003-06-09
4. Timing, Test and Manufacturing Overview;The Best of ICCAD;2003
5. Synthesis of symmetric functions for path-delay fault testability;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2000