Author:
Pomeranz Irith,Reddy Sudhakar M.
Cited by
2 articles.
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1. Delay Fault Coverage Increasing in Digital Circuits;2013 Euromicro Conference on Digital System Design;2013-09
2. Hybrid Test Application in Partial Skewed-Load Scan Design;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2011