Author:
Lofrano Melina,Pedreira Olalla Varela,Ciofi Ivan,Oprins Herman,Park Seongho,Tokei Zsolt
Cited by
4 articles.
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1. Towards accurate temperature prediction in BEOL for reliability assessment (Invited);2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
2. Thermal analysis of advanced back-end-of-line structures and the impact of design parameters;2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm);2022-05-31
3. Impact of FEOL cross-heating on the thermal performance of advanced BEOL;2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm);2022-05-31
4. Assessment of critical Co electromigration parameters;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03