Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper

Author:

Lienig Jens,Rothe Susann,Thiele Matthias,Rangarajan Nikhil,Ashraf Mohammed,Nabeel Mohammed,Amrouch Hussam,Sinanoglu Ozgur,Knechtel Johann

Publisher

IEEE

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Comparison of Si and SiC MOSFETs responses to electrical stress and the observation of parameter recovery in SiC MOSFET by stress superposition;Engineering Research Express;2024-08-06

2. An Efficient Security Closure Methodology for EM-based Attacks on Power Grid Structures;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

3. An Optimal Methodology for EM-Based Hardware Trojan Placement on Clock Tree Networks;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06

4. Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects;2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2022-08-22

5. Benchmarking Security Closure of Physical Layouts;Proceedings of the 2022 International Symposium on Physical Design;2022-04-13

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