Evaluation of Heavy-Ion-Induced SEU Cross Sections of a 65-nm Thin BOX FD-SOI Flip-Flops Based on Stacked Inverter-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Evaluation of Heavy-Ion-Induced SEU Cross Sections of a 65-nm Thin BOX FD-SOI Flip-Flops Based on Stacked Inverter

Published:2018-09 Issue: Volume: Page:
ISSN:
Container-title:2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
language:
Short-container-title:

Author:

Furuta Jun,Kojima Kentaro,Kobayashi Kazutoshi

Funder

JSPS KAKENHI

Program on Open Innovation Platform with Enterprises, Research Institute and Academia

Japan Science and Technology Agency

University of Tokyo

Cadence Corporation

Synopsys Corporation

Mentor Graphics Corporation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9328647/9328648/09328724.pdf?arnumber=9328724

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Partially-redundant Flip-flip Suitable for Mitigating Single Event Upsets in a FD-SOI Process with Low Performance Overhead;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

2. SEU performance of Schmitt-trigger-based flip-flops at the 22-nm FD SOI technology node;Microelectronics Reliability;2023-07

3. Efficacy of Transistor Stacking on Flip-Flop SEU Performance at 22-nm FDSOI Node;IEEE Transactions on Nuclear Science;2023-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP