Author:
Inoue M.,Yamada T.,Fujiwara A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
16 articles.
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1. A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit;IETE Journal of Research;2017-02-17
2. A Novel Controllable BIST Circuit for embedded SRAM;The Open Electrical & Electronic Engineering Journal;2016-01-29
3. Testing Embedded Memories: A Survey;Mathematical and Engineering Methods in Computer Science;2013
4. Comparison of different test strategies on a mixed-signal circuit;2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems;2009
5. The state-of-art and future trends in testing embedded memories;Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004.;2004