Testing Embedded Memories: A Survey

Author:

Hamdioui Said

Publisher

Springer Berlin Heidelberg

Reference54 articles.

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3. Mookerjee, R.: Segmentation: A Technique for Adapting High-Performance Logic ATE to Test High-Density, High-Speed SRAMs. In: IEEE Workshop on Memory Test, pp. 120–124 (1993)

4. Suk, D.S., Reddy, S.M.: A March Test for Functional Faults in Semiconductors Random-Access Memories. IEEE Transactions on Computers C-30(12), 982–985 (1981)

5. Abadir, M.S., Reghbati, J.K.: Functional Testing of Semiconductor Random Access Memories. ACM Computer Surveys 15(3), 175–198 (1983)

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