Edge terminations for SiC high voltage Schottky rectifiers

Author:

Bhatnagar M.,Nakanishi H.,Bothra S.,McLarty P.K.,Baliga B.J.

Publisher

IEEE

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Investigation of Lateral Gallium Oxide MOSFET with Discrete Field Plate by Calibrated Numerical Simulation;2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS);2023-02-07

2. 1200-V 4H-SiC Merged p-i-n Schottky Diodes With High Avalanche Capability;IEEE Transactions on Electron Devices;2020-09

3. Diamond Schottky barrier diodes with floating metal rings for high breakdown voltage;Materials Science in Semiconductor Processing;2019-07

4. High-Voltage β-Ga2O3 Schottky Diode with Argon-Implanted Edge Termination;Nanoscale Research Letters;2019-01-07

5. Breakdown Voltage;Fundamentals of Power Semiconductor Devices;2018-09-29

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