Author:
Huang Y.S.,Baliga B.J.,Tandon S.,Reisman A.
Cited by
2 articles.
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1. A Novel Low Loss Planar Gate LIGBT With P-type Buried Layer;2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2024-03-03
2. Simulation study of a novel thin layer SOI carrier-stored TLIGBT with self-biased pMOS;Semiconductor Science and Technology;2019-10-03