A Machine Learning Attack-Resilient Strong PUF Leveraging the Process Variation of MRAM

Author:

Ali Rashid1ORCID,Zhang Deming1ORCID,Cai Hao2ORCID,Zhao Weisheng1ORCID,Wang You1ORCID

Affiliation:

1. Anhui High Reliability Chips Engineering Laboratory, Hefei Innovation Research Institute, Beihang University, Hefei, China

2. National ASIC Center, Southeast University, Nanjing, China

Funder

Beihang Hefei Innovation Research Institute Project

Science and Technology Major Project of Anhui Province

National Science Foundation of China Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A robust deep learning attack immune MRAM-based physical unclonable function;Scientific Reports;2024-09-04

2. MTJ-PUF with Input Decoder and Evaluation of Machine Learning Resistance;2024 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2024-07-02

3. A Design of 2-Stage Voltage Ramp-Up SRAM Physical Unclonable Function;Chinese Journal of Electronics;2024-03

4. Era of Sentinel Tech: Charting Hardware Security Landscapes Through Post-Silicon Innovation, Threat Mitigation and Future Trajectories;IEEE Access;2024

5. VXorPUF: A Vedic Principles - Based Hybrid XOR Arbiter PUF for Robust Security in IoMT;Internet of Things. Advances in Information and Communication Technology;2023-10-26

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