Simulation of electrolytic capacitance for the oxide-based electric-double-layer transistors
Author:
Affiliation:
1. Jiangnan University,Department of Electronic Engineering,Wuxi,China
2. Nanjing University of Posts and Telecommunications,College of Integrated Circuit Science and Engineering,Nanjing,China
Funder
National Natural Science Foundation of China
Natural Science Foundation of Jiangsu Province
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10221568/10221569/10221668.pdf?arnumber=10221668
Reference19 articles.
1. Short-Term Plasticity and Synaptic Filtering Emulated in Electrolyte-Gated IGZO Transistors
2. Modeling Novel Double-in-Plane Gate Electric-Double-Layer Thin-Film and Nanoscale Transistors
3. Graphene Transistors Gated by Salted Proton Conductor
4. Exploration of Nafion for the Electric-Double-Layer Gating of Metal-Oxide Thin Film Transistors
5. Neuromorphic Simulation of Proton Conductors Laterally Coupled Oxide-Based Transistors With Multiple in-Plane Gates
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