The Bitmap Decryption Model on Interleaved SRAM Using Multiple-Bit Upset Analysis-Reference-Cited by-同舟云学术

The Bitmap Decryption Model on Interleaved SRAM Using Multiple-Bit Upset Analysis

Published:2022-08 Issue:8 Volume:69 Page:1857-1864
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Guo Jinlong¹^ORCID,Mao Guangbo¹,Liu Wenjing¹,Shao Cuiping²^ORCID,Wu Ruqun¹,Li Yaning³,Zhao Jing¹,Shen Cheng¹,Mou Hongjin¹,Zhang Lei¹,Li Huiyun²^ORCID,Du Guanghua¹^ORCID

Affiliation:

1. Materials Research Center, Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, China

2. Chinese Academy of Sciences, Shenzhen Institutes of Advanced Technology, Shenzhen, China

3. Department of Mathematics and Physics, Hebei GEO University, Shijiazhuang, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/9858187/09805792.pdf?arnumber=9805792

Reference32 articles.

1. i-SRAM: Interleaved Wordlines for Vector Boolean Operations Using SRAMs

2. Address and data scrambling: causes and impact on memory tests

3. Design and analysis of an adjacent multi-bit error correcting code for nanoscale SRAMs;neale,2014

4. Reliability Analysis of Memories Suffering Multiple Bit Upsets

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