A Survey of Defect Detection Applications Based on Generative Adversarial Networks-Reference-Cited by-同舟云学术

A Survey of Defect Detection Applications Based on Generative Adversarial Networks

Author:

He Xiangjie¹^ORCID,Chang Zhengwei²,Zhang Linghao²,Xu Houdong³,Chen Hongbo⁴,Luo Zhongqiang¹^ORCID

Affiliation:

1. School of Automation and Information Engineering, Sichuan University of Science and Engineering, Yibin, China

2. State Grid Sichuan Electric Power Research Institute, Chengdu, China

3. State Grid Sichuan Electric Power Company, Chengdu, China

4. Sichuan Shuneng Electric Power Company Ltd., Chengdu, China

Funder

National Natural Science Foundation of China

Sichuan Science and Technology Program

Sichuan University of Science and Engineering Talent Introduction Project

Innovation Fund of Chinese Universities

Artificial Intelligence Key Laboratory of Sichuan Province Project

2022 Graduate Innovation Fund of Sichuan University of Science and Engineering

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

Reference126 articles.

1. Conditional generative adversarial nets;mirza;Comput Sci,2014

2. Generative adversarial nets;goodfellow;Proc Adv Neural Inf Process Syst (NIPS),2014

3. Mixed supervision for surface-defect detection: From weakly to fully supervised learning;boži?;Comput Ind,2021

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