Low-Frequency Noise in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors-Reference-Cited by-同舟云学术

Low-Frequency Noise in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

Author:

Yang Yuyang¹,Zhang Meng¹^ORCID,Lu Lei²^ORCID,Wong Man³^ORCID,Kwok Hoi-Sing³

Affiliation:

1. College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China

2. School of Electronic and Computer Engineering, Peking University, Shenzhen, China

3. State Key Laboratory of Advanced Displays and Optoelectronics Technologies, Hong Kong University of Science and Technology, Hong Kong

Funder

Basic and Applied Basic Research Foundation of Guangdong Province

National Taipei University of Technology–Shenzhen University Joint Research Program

Natural Science Foundation of Shenzhen University

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

Reference33 articles.

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