Off-State Current Degradation Behavior of Polycrystalline Silicon Thin-Film Transistors under Dynamic Drain Voltage Stress-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Off-State Current Degradation Behavior of Polycrystalline Silicon Thin-Film Transistors under Dynamic Drain Voltage Stress

Published:2023-07-24 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
language:
Short-container-title:

Author:

Zhang Meng¹,Song Yiming²,Jiang Zhendong¹,Xu Xindi²,Wong Man³,Kwok Hoi-Sing³

Affiliation:

1. Shenzhen University,College of Electronics and Information Engineering,Shenzhen,China,518060

2. Institute of Microscale Optoelectronics (IMO), Shenzhen University,Shenzhen,China,518060

3. The Hong Kong University of Science and Technology,State Key Laboratory of Advanced Displays and Optoelectronics Technologies,Kowloon,Hong Kong

Funder

National Natural Science Foundation of China

Innovation and Technology Fund

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10248978/10248979/10249125.pdf?arnumber=10249125

Reference26 articles.

1. Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation

2. Reversely-Synchronized-Stress-Induced Degradation in Polycrystalline Silicon Thin-Film Transistors and Its Suppression by a Bridged-Grain Structure

3. A High-Gain Inverter With Low-Temperature Poly-Si Oxide Thin-Film Transistors

4. Characterization of hot carrier degradation in n-type poly-Si TFTs under dynamic drain pulse Stress with DC gate bias

5. Degradation of metal-induced laterally crystallized n-type poly-Si thin-film transistors under dynamic voltage stress

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP