Performance of a Novel Rear-Triggered 4H-SiC Photoconductive Semiconductor Switch
Author:
Affiliation:
1. Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang, China
2. State Key Laboratory of Crystal Materials and the Institute of Novel Semiconductors, Shandong University, Jinan, China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/10025571/09992256.pdf?arnumber=9992256
Reference17 articles.
1. Effect of n+-GaN subcontact layer on 4H–SiC high-power photoconductive switch
2. Influence of different illumination profiles on the on-state resistances of silicon carbide photoconductive semiconductor switches
3. Contact Extensions Over a High-k Dielectric Layer for Surface Field Mitigation in High Power 4H-SiC Photoconductive Switches
4. Performance and characterization of a 20 kV, contact face illuminated, silicon carbide photoconductive semiconductor switch for pulsed power applications;mauch;Proc Abstr IEEE Int Conf Plasma Sci (ICOPS),2013
5. Performance Modeling of Silicon Carbide Photoconductive Switches for High-Power and High-Frequency Applications
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