Author:
Boutobza S.,Nicolaidis M.,Lamara K.M.,Costa A.
Cited by
5 articles.
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1. Review on BIST architectures of DRAMs;2023 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS);2023-02-18
2. A cellular automata based highly accurate memory test hardware realizing March C−;Microelectronics Journal;2016-06
3. Fully Programmable Memory BIST for Commodity DRAMs;ETRI Journal;2015-08-01
4. Symmetry Measure for Memory Test and Its Application in BIST Optimization;Journal of Electronic Testing;2011-09-09
5. Memory Testing and Self-Repair;Design and Test Technology for Dependable Systems-on-Chip