A cellular automata based highly accurate memory test hardware realizing March C−-Reference-Cited by-同舟云学术

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A cellular automata based highly accurate memory test hardware realizing March C−

Published:2016-06 Issue: Volume:52 Page:91-103
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Saha Mousumi^ORCID,Dalui Mamata,Sikdar Biplab K

Publisher

Elsevier BV

Subject

General Engineering

Reference28 articles.

1. C. Wu, Memory Testing, Lab for Reliable Computing (LaRC), EE, NTHU.

2. C. Wu, Ram Fault Models and Memory Testing, Lab for Reliable Computing (LaRC), EE, NTHU.

3. Diagnosis and Reliable Design of Digital Systems;Breuer,1976

4. An optimal algorithm for testing stuck-at faults in random access memories;Knaizuk;IEEE Trans. Comput.,1977

5. Testing Semiconductor Memories, Theory and Practice;van de Goor,1991

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1. Identification of ECA rules forming MACA in periodic boundary condition;International Journal of Modern Physics C;2024-07-02

2. Characterization of Single Length Cycle Two-Attractor Cellular Automata Using Next-State Rule Minterm Transition Diagram;Complex Systems;2022-12-15

3. Exploring ECA Rules With Quantum-Dot Cellular Automata;2022 International Conference on Futuristic Technologies (INCOFT);2022-11-25

4. NSRT diagram for identification of SACA and TACA rules in null-boundary;International Journal of Modern Physics C;2022-01-28

5. Nature-Inspired Computing Behaviour of Cellular Automata;Lecture Notes in Electrical Engineering;2020-11-26

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