Too much delay fault coverage is a bad thing-Reference-Cited by-同舟云学术

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Too much delay fault coverage is a bad thing

Published: Issue: Volume: Page:
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Container-title:Proceedings International Test Conference 2001 (Cat. No.01CH37260)
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Author:

Rearick J.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/7640/20866/00966682.pdf?arnumber=966682

Cited by 155 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Two-dimensional Search Space for Extracting Broadside Tests from Functional Test Sequences;ACM Transactions on Design Automation of Electronic Systems;2024-04-22

2. Compaction of Functional Broadside Tests for Path Delay Faults Using Clusters of Propagation Lines;2023 IEEE International Test Conference (ITC);2023-10-07

3. Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

4. Expanding a Pool of Functional Test Sequences to Support Test Compaction;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

5. Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-04

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