Effective and efficient test architecture design for SOCs
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/8073/22329/01041803.pdf?arnumber=1041803
Cited by 83 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Proficient Test Data Compression and Decompression System for Enhanced Test Competence in SOC Testing;2023 International Conference on Inventive Computation Technologies (ICICT);2023-04-26
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3. PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community;2020 IEEE European Test Symposium (ETS);2020-05
4. System Test Architecture Evaluation: A Probabilistic Modeling Approach;IEEE Systems Journal;2019-12
5. Time-Multiplexed 1687-Network for Test Cost Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-08
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