Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
https://link.springer.com/content/pdf/10.1007/s10836-021-05980-y.pdf
Reference43 articles.
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4. Chandrasekharan A, Eggersglüß S, Große D, Drechsler R (2018) Approximation-aware testing for approximate circuits. In Proc. 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), Jeju Island, Korea, pp. 239–244
5. Chippa VK, Chakradhar ST, Roy K, Raghunathan A (2013) Analysis and characterization of inherent application resilience for approximate computing. In: Proc. 50th ACM/EDAC/IEEE Design Automation Conference (DAC), Austin, TX pp. 1–9
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