Novel Quadruple-Node-Upset-Tolerant Latch Designs with Optimized Overhead for Reliable Computing in Harsh Radiation Environments

Author:

Yan Aibin,Xu Zhelong,Feng Xiangfeng,Cui Jie,Chen Zhili,Ni Tianming,Huang Zhengfeng,Girard Patrick,Wen Xiaoqing

Funder

JSPS Grant-in-Aid for Scientific Research

China Scholarship Council

Anhui University Doctor Startup Fund

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Science Applications,Human-Computer Interaction,Information Systems,Computer Science (miscellaneous)

Cited by 63 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

3. NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization;IEEE Transactions on Aerospace and Electronic Systems;2024-08

4. MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-07

5. A highly reliable and low-overhead quadruple-node-upset tolerant latch design;Microelectronics Reliability;2024-06

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