Author:
Sharma Kanuj,Kamm Simon,Afanasenko Valentyna,Munoz Baron Kevin,Kallfass Ingmar
Funder
The Federal Ministry of Education (BMBF)
Cited by
3 articles.
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1. High-Resolution Time Domain Reflectometry in Advanced Package Failure Analysis;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17
2. Hybrid Model of Power MOSFET for Soft Failures Estimation Based on Time Domain Reflectometry and Machine Learning;2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia);2023-05-22
3. Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors;2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA);2022-09-06