Noise Analysis and Characterization of a Sigma-Delta Capacitive Microaccelerometer-Reference-Cited by-同舟云学术

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Noise Analysis and Characterization of a Sigma-Delta Capacitive Microaccelerometer

Published:2006-02 Issue:2 Volume:41 Page:352-361
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:en
Short-container-title:IEEE J. Solid-State Circuits

Author:

Kulah H.,Chae J.,Yazdi N.,Najafi K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/33427/01583799.pdf?arnumber=1583799

Cited by 136 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. A Nearing-Free Constrained Architecture for Systematic Design of Electromechanical Sigma-Delta Modulator;IEEE Transactions on Circuits and Systems I: Regular Papers;2024

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