Gallium Nitride Efficacy for High-Reliability Forward Converters in Spacecraft
Author:
Affiliation:
1. Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, USA
2. Honeywell Aerospace, Clearwater, FL, USA
Funder
industry and agency members of the NSF Center for Space, High-performance, and Resilient Computing
IUCRC Program of the National Science Foundation
Honeywell Aerospace
University of Pittsburgh Central Research Development Fund
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Energy Engineering and Power Technology
Link
https://ieeexplore.ieee.org/ielam/6245517/9908063/9775978-aam.pdf
Reference20 articles.
1. Radiation hardness testing for electronics against high energy ions;takahiro;Radioisotopes,2019
2. Failure Estimates for SiC Power MOSFETs in Space Electronics
3. Radiation hardness study on SiC power MOSFETs;zhu;Proc Int Conf Silicon Carbide Related Mater,2017
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