A 325<i>F</i> <sup>2</sup> Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio-Reference-Cited by-同舟云学术

A 325F ² Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio

Published:2023-04 Issue:4 Volume:58 Page:1185-1196
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Jeon Duhyun¹^ORCID,Lee Dongmin²,Kim Dong Kyue²^ORCID,Choi Byong-Deok²^ORCID

Affiliation:

1. SoC Group, ICTK Holdings, Seongnam, South Korea

2. Department of Electronic Engineering, Hanyang University, Seoul, South Korea

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/10082904/09834320.pdf?arnumber=9834320

Reference31 articles.

1. 14.2 A physically unclonable function with BER <10⁻⁸ for robust chip authentication using oscillator collapse in 40nm CMOS

2. A 373-F² 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and VSS Bias-Based Dark-Bit Detection

3. 8.3 A 553F2 2-transistor amplifier-based Physically Unclonable Function (PUF) with 1.67% native instability

4. 36.4 A Physically Unclonable Function Combining a Process Mismatch Amplifier in an Oscillator Collapse Topology

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