MOMENT: A Cross-Layer Method to Mitigate Multiple Event Transients in Combinational Circuits-Reference-Cited by-同舟云学术

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MOMENT: A Cross-Layer Method to Mitigate Multiple Event Transients in Combinational Circuits

Published:2018-08 Issue: Volume: Page:
ISSN:
Container-title:2018 21st Euromicro Conference on Digital System Design (DSD)
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Author:

Hajisadeghi Amir M.,Bardareh Hossein,Zarandi Hamid R.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8490807/8491778/08491823.pdf?arnumber=8491823

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. CLEAR: A Cross-Layer Soft Error Rate Reduction Method Based on Mitigating DETs in Nanoscale Combinational Logics;Microprocessors and Microsystems;2021-09

2. Study on Energy Reduction Techniques in STT-RAM;Journal of Physics: Conference Series;2021-01-01

3. Improving Combinational Circuit Reliability Against Multiple Event Transients via a Partition and Restructuring Approach;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-05

4. DYSCO: DYnamic Stepper Current InjectOr to improve write performance in STT-RAM memories;Microprocessors and Microsystems;2020-03

5. TAMPER: Thermal Assistant Method to Improve Write PERformance in STT-RAM Memories;2019 27th Iranian Conference on Electrical Engineering (ICEE);2019-04

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