Sub-0.5 ns Step, 10-bit Time Domain Digital Gate Driver IC for Reducing Radiated EMI and Switching Loss of SiC MOSFETs

Author:

Horii Kohei1,Morikawa Ryuzo1,Hata Katsuhiro1,Morokuma Kenichi2,Wada Yukihiko2,Obiraki Yoshiko2,Mukunoki Yasushige2,Takamiya Makoto1

Affiliation:

1. The University of Tokyo,Tokyo,Japan

2. Mitsubishi Electric Corporation,Hyogo,Japan

Publisher

IEEE

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Digital Active Gate Driving Automatically Minimizing Switching Loss While Keeping Surge Current Below User-Specified Target;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17

2. Active Gate Driving With Full 6-Bit Resolution for Different SiC MOSFETs Using Variable Gate Current Range Digital Gate Driver IC;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17

3. Operation Point based Optimization of Switching Losses with Current-Source Gate Driver for SiC-based Power Modules;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25

4. Variable Gate Current Range Digital Gate Driver IC Always Providing 6-bit Controllability in Various IGBTs;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25

5. Large-Current Output Digital Gate Driver for 6500 V, 1000 A IGBT Module to Reduce Switching Loss and Collector Current Overshoot;IEEE Transactions on Power Electronics;2023-07

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