1. Storage-Based Logic Built-In Self-Test with Variable-Length Test Data;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
2. Zoom-In Feature for Storage-Based Logic Built-In Self-Test;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06
3. Storage-Based Built-In Self-Test for Gate-Exhaustive Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-10
4. DART—A Concept of In-field Testing for Enhancing System Dependability;VLSI Design and Test for Systems Dependability;2018-07-21