Author:
Brendler Leonardo H.,Zimpeck Alexandra L.,Meinhardt Cristina,Reis Ricardo
Cited by
9 articles.
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1. Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation;2023 IEEE International Symposium on Circuits and Systems (ISCAS);2023-05-21
2. Design of novel low power architectures of 4:2, 5:2 compressors and 2-bit counter using 7 nm FinFET technology;Journal of Ambient Intelligence and Humanized Computing;2022-12-11
3. General Trade-Offs;Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs;2021
4. Reliability Challenges in FinFETs;Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs;2021
5. Circuit design using Schmitt Trigger to reliability improvement;Microelectronics Reliability;2020-11