All-Digital-Very-Scalable-ADC TAD Showing Scaling-Effect in 40/16nm-CMOS Technology
-
Published:2018-12
Issue:
Volume:
Page:
-
ISSN:
-
Container-title:2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
-
language:
-
Short-container-title:
Author:
Watanabe Takamoto
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Time Based and VCO-ADCs from a Signal Processing Perspective;Time-encoding VCO-ADCs for Integrated Systems-on-Chip;2022
2. All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS;2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS);2021-11-28
3. All-Digital VCO-ADC TAD Using 4CKES-Type in 16-nm FinFET CMOS for Technology Scaling With Stochastic-ADC Method;2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS);2021-11-28