All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS-Reference-Cited by-同舟云学术

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All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS

Published:2021-11-28 Issue: Volume: Page:
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Container-title:2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)
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Author:

Watanabe Takamoto¹

Affiliation:

1. DENSO CORPORATION,Kariya,Japan

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9665417/9665446/09665569.pdf?arnumber=9665569

Reference16 articles.

1. A maximally-digital radio receiver front-end

2. All-Digital-Very-Scalable-ADC TAD Showing Scaling-Effect in 40/16nm-CMOS Technology

3. An Oversampling Stochastic ADC Using VCO-Based Quantizers

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time-Encoded Mostly Digital Feature Extraction for Voice Activity Detection Tasks;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19

2. A 0.5 V Modified Pseudo-Differential Current-Starved Ring-VCO with Linearity Improvement for IoT Devices;2023 International Electrical Engineering Congress (iEECON);2023-03-08

3. An Unbiased MEMS Capacitance-Controlled Oscillator as a Microphone for HMI Applications;2022 Austrochip Workshop on Microelectronics (Austrochip);2022-10-11

4. All-Digital VCO-ADC TAD Using 4CKES-Type in 16-nm FinFET CMOS for Technology Scaling With Stochastic-ADC Method;2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS);2021-11-28

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