Impact of Supply Voltage and Frequency on the Soft Error Rate of Logic Circuits-Reference-Cited by-同舟云学术

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Impact of Supply Voltage and Frequency on the Soft Error Rate of Logic Circuits

Published:2013-12 Issue:6 Volume:60 Page:4200-4206
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Mahatme N. N.,Gaspard N. J.,Jagannathan S.,Loveless T. D.,Bhuva B. L.,Robinson W. H.,Massengill L. W.,Wen S.-J.,Wong R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/6678952/06678289.pdf?arnumber=6678289

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3. Error Resilience in Deep Neural Networks Using Neuron Gradient Statistics;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023

4. Single event transients induced by pulse laser in Ge pMOSFETs and its supply voltage dependence;Science China Information Sciences;2022-04-26

5. Experimental Investigation of Charge Sharing Induced SET Depending on Transistors in Abutted Rows in 65 nm Bulk CMOS Technology;IEEE Access;2022

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