Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software-Reference-Cited by-同舟云学术

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Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software

Published:2017-06 Issue: Volume: Page:
ISSN:
Container-title:2017 International Siberian Conference on Control and Communications (SIBCON)
language:
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Author:

Shvetsov-Shilovskiy I. I.,Boruzdina A. B.,Ulanova A. V.,Orlov A. A.,Amburkin K. M.,Nikiforov A. Y.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7990451/7998419/07998542.pdf?arnumber=7998542

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of space radiation on resistive memory and comparison with other types of non-volatile memory;2022 Moscow Workshop on Electronic and Networking Technologies (MWENT);2022-06-09

2. Measurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13

3. Features of the Software Component of the Memory Test SetupBased on the Object-Oriented Approach in LabVIEW Development Environment;2021 International Siberian Conference on Control and Communications (SIBCON);2021-05-13

4. Method for Determining the Most Sensitive Region of an Optocoupler Chip under X-ray-Induced Dose Effects;Russian Microelectronics;2019-11

5. Inter-Device Radiation-Induced Leakages in the Bulk 180-nm CMOS Technology;Russian Microelectronics;2019-07

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