Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
37 articles.
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1. The Coupling Model for Function and Delay Faults;Journal of Electronic Testing;2005-12
2. Eliminating false positives in crosstalk noise analysis;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2005-09
3. Timing, Test and Manufacturing Overview;The Best of ICCAD;2003
4. Delay fault testing of IP-based designs via symbolic path modeling;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2001-10
5. On redundant path delay faults in synchronous sequential circuits;IEEE Transactions on Computers;2000-03