Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits-Reference-Cited by-同舟云学术

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Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits

Published:1967-10 Issue:5 Volume:EC-16 Page:567-580
ISSN:0367-7508
Container-title:IEEE Transactions on Electronic Computers
language:
Short-container-title:IEEE Trans. Electron. Comput.

Author:

Roth J. Paul,Bouricius Willard G.,Schneider Peter R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx5/4037753/4039137/04039146.pdf?arnumber=4039146

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