LDO-based Odometer to Combat IC Recycling
Author:
Affiliation:
1. University of Florida,Department of Electrical and Computer Engineering,Gainesville,FL,USA
2. Honeywell Aerospace,Clearwater,FL,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9739206/9739211/09739311.pdf?arnumber=9739311
Reference15 articles.
1. Trends and perspectives for electrical characterization and reliability assessment in advanced CMOS technologies
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4. Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits
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