What happens when circuits grow old: Aging issues in CMOS design-Reference-Cited by-同舟云学术

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What happens when circuits grow old: Aging issues in CMOS design

Published:2013-04 Issue: Volume: Page:
ISSN:
Container-title:2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
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Author:

Sapatnekar S. S.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6530992/6545273/06545621.pdf?arnumber=6545621

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Testing and Delay-Monitoring for the High Reliability of Memory-Based Programmable Logic Device;IEICE Transactions on Information and Systems;2024-01-01

2. Low-Cost Indirect Measurements for Power-Efficient In-Field Optimization of Configurable Analog Front-Ends with Self-X Properties: A Hardware Implementation;Chips;2023-05-01

3. Design of a Low-Voltage LNA with Considering Reliability and Variability Issues;Journal of The Institution of Engineers (India): Series B;2022-12-29

4. Invisible bits: hiding secret messages in SRAM’s analog domain;Proceedings of the 27th ACM International Conference on Architectural Support for Programming Languages and Operating Systems;2022-02-22

5. LDO-based Odometer to Combat IC Recycling;2021 IEEE 34th International System-on-Chip Conference (SOCC);2021-09-14

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