Characterization and Robustness Evaluation of 3.3 kV/40 mΩ SiC DMOSFETs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Characterization and Robustness Evaluation of 3.3 kV/40 mΩ SiC DMOSFETs

Published:2019-10 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)
language:
Short-container-title:

Author:

Mulpuri Vamsi,Jadav Sumit,Sundaresan Siddarth,Singh Ranbir

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8975928/8998758/08998847.pdf?arnumber=8998847

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Soft Switching ARCP Inverter Using Series Connected SiC MOSFETs for Medium Voltage Motor Drive Applications;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25

2. Performance Comparison of 10 kV and Series-connected 3.3 kV SiC MOSFETs based VSCs for MV Grid Interfacing Applications;2023 IEEE Applied Power Electronics Conference and Exposition (APEC);2023-03-19

3. Influence of the Inverter Dead-time on the Reverse Recovery Characteristics of 3.3-kV SiC MOSFETs and JBSFETs;2022 IEEE Energy Conversion Congress and Exposition (ECCE);2022-10-09

4. MMC-Based High Gain Solid-State Transformers for Energy Storage Applications;2021 IEEE Applied Power Electronics Conference and Exposition (APEC);2021-06-14

5. Medium Voltage Shore-to-Ship Connection System Enabled by Series Connected 3.3 kV SiC MOSFETs;2021 IEEE Applied Power Electronics Conference and Exposition (APEC);2021-06-14

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP