Affiliation:
1. CNRS, IM2NP, Aix-Marseille University, Marseille, France
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
4 articles.
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1. On the Reliability of RRAM-Based Neural Networks;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16
2. Characterization and Test of Intermittent Over RESET in RRAMs;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14
3. Device-Aware Test for Ion Depletion Defects in RRAMs;2023 IEEE International Test Conference (ITC);2023-10-07
4. Oxide-based Resistive RAM Analog Synaptic Behavior Assessment for Neuromemristive systems;Memristors - the Fourth Fundamental Circuit Element - Theory, Device, and Applications [Working Title];2023-09-29