MOZART+: Masking Outputs With Zeros for Improved Architectural Robustness and Testing of DNN Accelerators

Author:

Burel Stephane1,Evans Adrian1ORCID,Anghel Lorena2ORCID

Affiliation:

1. CEA, LIST, Univ. Grenoble Alpes, Grenoble, France

2. IRIG-Spintec Laboratory, Univ. Grenoble Alpes, CEA, CNRS, Grenoble INP (Institute of Engineering Univ. Grenoble Alpes), Grenoble, France

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

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5. Reliable classification with ensemble convolutional neural networks;gao;Proc IEEE Int Symp Defect Fault Tolerance VLSI Syst (DFT),2020

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